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 ¡¤ °í ºÐÇØ´É°ú ³ÐÀº ÀÛµ¿¿µ¿ª
    - XY nano positioning scanner : VCM, 100X100§­, 200X200§­ (option), 0.1nm PZT 80X80§­ (option)
    - Z nano positioning scanner : PZT, 10§­, 0.1nm
  ¡¤ ¿ëÀÌÇÑ ÆÁ ±³È¯ ¹× Á¤·Ä
  ¡¤ °í¼Ó ÀÚµ¿ ÆÁ Á¢±Ù
  ¡¤ CCD¸¦ ÀÌ¿ëÇÑ ÆÁ ¸ð´ÏÅ͸µ
  ¡¤ ºü¸¥ ½ÃÆí žÀç ¹× À̼Û
  ¡¤ ±âº»¸ðµ¨°ú È®Àå¸ðµ¨




¡¤ Standard model
   - Basic application modes : contact, non-contact, force modulation(option), phase detection(option)
   - High resolution nano scanner : XY axis(0.1§¬ resolution), Z axis(0.1§¬resolution)
   - Tip monitoring CCD
   - Image display S/W
   - Image analysis S/W
   - System control S/W

 ¡¤ Extended model
   - Standard model with advanced application modes : EFM, MFM
   - High resolution nano scanner : XY axis(0.1§¬ resolution), Z axis(0.05§¬resolution)



3D-Standard grating
(10§­x10§­, 15§¬ depth)

3D-Standard grating
(10§­x10§­, 15§¬ depth)

3D-Vicinal Si bunching
(0.1§­x0.1§­, 12§¬ depth)

3D-AI projection pattern
(5§­x5§­, 110§¬ depth)

Vicinal Si bunching
(5§­x5§­, 12§¬ depth)

3D-Profile of test gration
(5§­x5§­, 110§¬ depth)

2D-Poly ethylene latex
(1§­x1§­, 200§¬ depth)

3D-Poly ethylene latex
(1§­x1§­, 200§¬ depth)

3D-Profile of test grationg
(10§­x10§­, 15§¬ depth)
Membrane
non-contact mode
(5§­x5§­)
2D-AI projection pattern
(5§­x5§­)
3D-AI projection pattern
(5§­x5§­)


Spec. Components Performance
Mechanical XY Nano Positioning Scanner
 ¢Á Single module parallel kinematics flexure stage
    with PZT (option)
  - Sample size : up to 50§® ¡¿ 50§®, 10§® thick
  - Sample mass : up to 500gr
  - Scanning area : 100 ¡¿ 100§­, 200 ¡¿ 200§­ (option)
  - PZT 80 x 80§­ (option)
  - Resolution : £¼ 0.1 nm
  - Capacitive Sensor (option)
  - Manual stage travel : 30§® ¡¿ 30§® (option)
Z Nano Positioning Scanner
 ¢Á guide flexure stage with PZT
  - Scanning range : 10 §­
  - Resolution : £¼ 0.1 nm
Electrical
 ¢Á Power supply : 220V AC
 ¢Á DSP Multi TMS320 LF2812
  - 16 bit ADC, 4 channels
  - 16 bit gain controlled DAC, 3 channels
  - USB interface

 

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